RUBEL, Asrafusjaman; KABIR, M. A.; RANA, Masud; ISLAM, Ariful; ALI KHAN, Md. Shawkut. Characterization Analysis of Textured and Diffused Monocrystalline Silicon Wafer. European Scientific Journal, ESJ, [S. l.], v. 17, n. 17, p. 125, 2021. DOI: 10.19044/esj.2021.v17n17p125. Disponível em: https://test.eujournal.org/index.php/esj/article/view/14329. Acesso em: 9 apr. 2025.